PRESS/ARTICLE

MIRTEC participated in JPCA Show 2026, held at Tokyo Big Sight in Japan for three days from June 10 to June 12. We would once again like to extend our sincere appreciation to everyone who visited the MIRTEC booth during the exhibition.

At JPCA Show 2026, MIRTEC showcased the following inspection systems:

• “ART,” a 3D AOI system capable of inspecting highly reflective surfaces
• “GENESYS-CC,” capable of detecting micro-bubbles and coating in blind spots
• The new “MV-6 OMNI Alpha” 3D AOI system
• The world-leading “MV-3 OMNI MARK II” desktop inspection system

Unlike previous exhibitions, this year’s event also demonstrated a significant level of interest among Japanese customers in MIRTEC’s AI-based systems. MIRTEC’s advanced AI technologies and the inspection systems powered by these technologies once again highlighted the outstanding performance and technological competitiveness of MIRTEC’s inspection solutions.

The three-day JPCA Show 2026 provided MIRTEC with a valuable opportunity to identify the technologies and market segments currently attracting attention in Japan.

Finally, MIRTEC sincerely hopes that all visitors gained valuable insights and enjoyed a memorable experience at JPCA Show 2026.​